ST5680
The DC Hipot Tester ST5680 tests for reliable insulation with a waveform by applying a high voltage to the object under test. The instrument applies a DC voltage between test locations and measures leakage current to determine insulation performance.
- Verify battery safety and insulation performance using the waveform.
- High-spec model specifically designed for DC withstand voltage testing. With support for an array of delivery inspections.
- Features arc detection and contact check functions to prevent shipment of defective batteries.
Main functions |
DC Hipot test, Insulation resistance test, Breakdown voltage test, Waveform display functionality, Arc discharge detection, Contact check function |
List of other features |
Interlock, Auto discharge, Offset cancellation, Variable measurement speed (3 stages), Momentary out, Command monitor, I/O handler test, Key lock, Self-check, Calibration deadline check, EXT SW (Remote control) |
Operating temperature and humidity range |
0°C to 40°C (32°F to 104°F), 80% RH or less (non-condensing) |
Standards |
Safety: IEC 61010 |
Power supply |
100 to 240 V AC |
Power consumption |
Approx. 180 VA |
Maximum rated power |
800 VA |
Interface |
Communications: USB, LAN, EXT I/O |
Dimensions and mass |
Approx. 305 mm (12.01 in) W × 142 mm (5.59 in) H × 430 mm (16.93 in) D (excluding protruding parts), Approx. 10 kg (352.7 oz) |
Included accessories |
Power cord ×1, CD ×1 (PDF: Instruction Manual, Communication Instruction Manual), EXT I/O male connector ×1, EXT I/O connector cover ×1, Custom-made interlock-canceling connector for the EXT I/O ×1, Startup Guide ×1 |
Various Tests and Functionality
DC Hipot test |
Output voltage: DC 0.010 kV to 8.000 kV (1 V resolution) |
Insulation resistance test |
Output voltage: 10 V DC to 2000 V (1 V resolution) |
Breakdown voltage test |
Test method: Continuous voltage rise test, stepped voltage rise test |
Waveform display functionality |
Waveform display: Voltage, current, insulation resistance |
Arc discharge detection |
Detection method: Monitoring of fluctuations in the test voltage |
Contact check functionality |
Detection method: Capacitance measurement method |
Memory functionality |
- Saving of waveforms/graphs: |
Judgment functionality (Judgment output) |
PASS judgment, FAIL judgment (UPPER FAIL, LOWER FAIL) |