Scanning Electron Microscope (SEM)

JCM-7000 NeoScope™ Benchtop SEM

Contaminant analysis

Easy to detect foreign material
Easy to identify elemental composition
【Example】 Analysis of black foreign material adhered to surface of food product

OM image

In OM image, it is difficult to see the distribution of the whilte lubricant on the white granule(drug) surface and quality of its adhesion.

SEM Image (Backscattered electron compositional image)

SEM image from the same field of view (FOV) shows particles with different contrast indicating different compositions.

SEM Image (Backscattered electron compositional image) and elemental analysis result

Enlarging the area of interest accesses instant live EDS analysis with main elements identified.

Quality control

Observe detailed surface structures with high resolution and large depth of field not possible with OM imaging.
【Example】 Distribution observation of lubricant on the surface of granule(drug)

OM image

In OM image, it is difficult to see the distribution of the lubricant on the granule surface and quality of its adhesion.

SEM Image(Backscattered electron compositional image)

The superior depth of focus provided with SEM imaging over OM imaging along with the compositional contrast provided with the backscattered electron detector clearly shows the distribution of the lubricant on the surface of the granule.

SEM Image (Backscattered electron compositional image) and elemental analysis

Condition of the lubricant's adhesion can be observed with higher magnification.