JSM-IT200
The scanning electron microscope (SEM) product line is easy to use and scalable.
- Software integrated multi-touch control feature makes operation efficient and user-friendly
The large and eucentric sample chamber makes sample control easy when working with large samples or even laboratories with large sample volumes.
The high-end opto-electronic system combined with the highly sensitive probe makes this product line the ideal choice for observing a wide variety of specimens.
- Glass has 2 modes: low vacuum and high vacuum.
+ In high vacuum mode: can take good pictures of conductive samples. For non-conductive specimens, to photograph the specimen it is necessary to have a thin conductive coating or to shoot with a low acceleration potential (potential step adjustable from 0.5-30kv).
In low vacuum mode, non-conductive specimens can be captured without coating.
- Switching between low and high vacuum modes is easy thanks to the graphical user interface or the main control panel.
- The screen uses multi-touch technology.
- Integrated quick operation function: there is a CCTV camera in the sample chamber, integrated with image conversion technology and intuitive sample measurement from real images to scanned electronic images.
- Integration of continuous analysis technology and simultaneous SEM image with EDS detector is convenient for surveying the area to be analyzed and increases the accuracy of the analysis technique.
- There is a function to record the sample measurement process and measurement conditions to simulate the analysis later.
- There is a function to continuously save the sample measurement results to allow use and re-analysis.
Resolution:
High vacuum mode
Resolution (SEI - secondary electronics):
- 3.0 nm (accelerating voltage 30 kV)
- 8.0 nm (accelerating voltage 3 kV)
- 15.0 nm (1 kV incremental voltage)
Low vacuum mode
Resolution (BEI - backscattered electrons):
- 4.0 nm (accelerating voltage 30 kV, BEI)
Adjustable pressure: 10 to 100 Pa
Magnification:
- Direct (real) magnification: 5 times to 300,000 times (Display size 128 mm x 96 mm)
- Display magnification: 14 times to 839,724 times (Display size 358 mm x 269 mm)
Function:
+ Lens reset: eliminates hysteresis
+ Zoom: resists shifting focus/focus shift when emission current changes
+ Wobbler: adjust the objective aperture axis
+ Preset stigmator: associated with loading the preset stigma values
+ WD display: displays working distance
+ Adjust the tilt of the sample to focus.
+ Automatic focus adjustment: Adjust auto focus.
+ Tracking convergence/autofocus
Sample stage, sample chamber, sample holder
- Move sample: Control 2 X and Y axis motors.
- Largest sample size: 150 mm diameter, can observe 117 mm diameter area
Receiver system
High vacuum
- Secondary electronic signal receiver (SE)
- Backscattered electronic signal receiver (BE)
Low vacuum
- Backscattered electronic signal receiver (BE)