Scanning Electron Microscope (SEM)

The scanning electron microscope (SEM) product line is easy to use and scalable.
  - Software integrated multi-touch control feature makes operation efficient and user-friendly
  The large and eucentric sample chamber makes sample control easy when working with large samples or even laboratories with large sample volumes.
  The high-end opto-electronic system combined with the highly sensitive probe makes this product line the ideal choice for observing a wide variety of specimens.
  - Glass has 2 modes: low vacuum and high vacuum.
    + In high vacuum mode: can take good pictures of conductive samples. For non-conductive specimens, to photograph the specimen it is necessary to have a thin conductive coating or to shoot with a low acceleration potential (potential step adjustable from 0.5-30kv).
   In low vacuum mode, non-conductive specimens can be captured without coating.
  - Switching between low and high vacuum modes is easy thanks to the graphical user interface or the main control panel.
  - The screen uses multi-touch technology.
  - Integrated quick operation function: there is a CCTV camera in the sample chamber, integrated with image conversion technology and intuitive sample measurement from real images to scanned electronic images.
  - Integration of continuous analysis technology and simultaneous SEM image with EDS detector is convenient for surveying the area to be analyzed and increases the accuracy of the analysis technique.
  - There is a function to record the sample measurement process and measurement conditions to simulate the analysis later.
  - There is a function to continuously save the sample measurement results to allow use and re-analysis.