Scanning Electron Microscope (SEM)
Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)

JSM-IT200

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Quantity
Out of stock (Please contact us directly)

Features

  • JSM-IT200 is an easy-to-use SEM focused on cost performance of high functionalities of JSM-IT500 of InTouchScopeTM, with significantly higher throughput.
  • Specimen Exchange Navi offers guided operation from sample loading to area search, and SEM image observation. “Zeromag” for seamless transition from optical to SEM imaging.
  • Live Analysis for real time display of elemental analysis results.
  • Provide fast analysis with integrated transition from OM to SEM.
  • Fast observation, analysis and report generation.
0972000270
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Status: Out of stock
Brand: JEOL
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