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Programmable AC/DC Power Source

ES series

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Features

2 kVA
Single Phase Master
Component style allows expansion after being introduced
Cabinet style is compact and requires small installation space
AC output voltage: 0 to 150 V/0 to 300 V, Frequency: 5 Hz to 1100 Hz
DC output voltage: 0 to + 203 V/0 to + 406 V
Voltage dips, voltage variations, simultaneous sweeping of frequency and voltage
Equipped with measurement function, protective circuit, remote sensing, and AGC function. External input available and peak current of 3.5 times of maximum RMS value can be supplied
Software (Immunty Test Software 2010 ES0406C) that performs low frequency immunity test of IEC standard is available
Performs power source harmonic measurement and various simulations. Furthermore, it can be used as CVCF for anechoic chamber or production line

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Status: Out of stock

Brand: NF Corporation

Type: Power Electronics Equipments

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Overview
Specification

The NF Corporation ES2000S is part of the P-STATION/ES Series Programmable AC/DC Power Source products designed to simulate various power supply environments for different applications. It can be used for:
1. Testing voltage dips, short interruptions, and voltage variations.
2. Measuring harmonic currents and flicker.
3. Simulating power waveforms as needed.
4. Connecting nodes in photovoltaic power systems.
5. Serving as a power source for anechoic chambers and production lines.
6. Converting voltage and frequency for export purposes.
7. Conducting tests related to inverters and motors.
8. Powering testing devices in aircraft.
The P-STATION/ES Series prioritizes performance, functionality, compactness, and user-friendliness. It offers the flexibility to create single-phase systems using the ES2000S as a base with ES2000B boosters, ranging from 2kVA to 20kVA. For three-phase systems, the ES2000U three-phase master and ES2000P three-phase slaves can be combined with ES2000B boosters, providing output power from 6kVA up to a maximum of 60kVA.
These systems provide stable output voltage with low waveform distortion, making them suitable for electronic device performance testing and EMC measurements.