CM-36dGV
The Spectrophotometer CM-36dGV, successor to the Spectrophotometer CM-3610A, is a high-precision and high-reliability benchtop color measuring instrument with advanced functions catering to today’s measurement needs.
The CM-36dGV can measure color in either reflectance or transmittance. Equipped with a 60° gloss sensor (ISO 2813 compliant), it enables simultaneous color and gloss measurement that improves work efficiency.
It comes with the patented Numerical UV Control (NUVC) that offers accurate and simple UV adjustments when measuring samples that contain optical brighteners (OBA) such as pulp, paper, and textiles.
The CM-36dGV offers a tight inter-instrument agreement (IIA) of ΔE*ab< 0.12 ΔE*ab< 0.12 and repeatability of σ∆E*ab < 0.02, assuring the measurement and its data are communicated within the supply chain, from suppliers to finished product maker, consistently.
This innovative benchtop spectrophotometer meter is design with enhanced useability. Its vertical orientation allows easy handling of samples such as cloth and paper. With the sample viewing function that uses an integrated camera, the CM-36dGV enables accurate and easy positioning sample.
The CM-36dGV has an easy-to-read status panel with the measuring button. It can display the measurement status and condition settings to minimize operator error and improve work efficiency. It also has four different aperture sizes (Ø 4.0 mm, 8.0 mm, 16.0 mm, and 25.4 mm) to cater to different measurement needs.
Come with the innovative WAA (Wavelength Analysis & Adjustment) function (optional )that analyzes and adjusts any wavelength shift during each calibration, the CM-36dGV can assure the instrument, and its measurement, remain accurate and reliable over time.
Color | Illumination/ Viewing System | Reflectance:
di:8°, de:8° (diffused illumination, 8° viewing), SCI (Specular Component Included) / SCE (Specular Component Excluded) switchable. Conforms to CIE No.15, lSO7724/1, ASTM E1164, DIN 5033 Teil7, and JIS Z 8722 condition c standards |
Transmittance:
di:0°, de:0° (diffused illumination, 0° viewing) Conforms to CIE No.15, ASTM E1164, DIN 5033 Teil7, and JIS Z 8722 condition g standards |
||
Integrating Sphere Size | Ø152 mm (6 inches) | |
Detector | Dual 40-element silicon photodiode arrays | |
Spectral Separation Device | Diffraction grating | |
Wavelength Range | 360 to 740 nm | |
Wavelength Pitch | 10 nm | |
Half Bandwidth | approx. 10 nm | |
Reflectance
Range |
0 to 200% | |
Resolution: 0.01% | ||
Light Source | 3 Pulsed xenon lamps (2 with UV cut filters) | |
Illumination / Measurement Area | LAV: Ø30.0 mm / Ø25.4 mm
LMAV: Ø20.0 mm / Ø16.0 mm MAV: Ø11.0 mm / Ø8.0 mm SAV: Ø7.0 mm / Ø4.0 mm Trans: Ø24.0 mm / Ø17.0 mm |
|
Repeatability | Colorimetric values: Standard deviation within ΔE*ab 0.02
Spectral reflectance: Standard deviation within 0.1% (When a white calibration plate is measured 30 times at 10-second intervals after white calibration) |
|
Inter-Instrument Agreement | Within ΔE*ab 0.12
(Based on average for 12 BCRA Series II color tiles; LAV/SCI. Compared to values measured with master body under Konica Minolta standard measurement conditions) |
|
UV Setting | 100% / 0% / Adjusted
Instantaneous numerical adjustment of UV with no mechanical filter movement required*1; 400 nm and 420 nm UV cutoff filters |
|
Gloss | Measurement Angle | 60° |
Light Source | White LED | |
Detector | Silicon photodiode | |
Measurement Range | 0 to 200 GU | |
Resolution: 0.01 GU | ||
Measurement Area | MAV (LAV/LMAV/MAV color measurement area):
Ø10.0 x 8.0 mm ellipse |
|
SAV (SAV color measurement):
Ø3.0 mm |
||
Repeatability | 0 to 10 GU: within 0.1 GU
10 to 100 GU: within 0.2 GU 100 to 200 GU: 0.2% (When measured 30 times at 10-second intervals) |
|
Inter-Instrument Agreement | 0 to 10 GU: ±0.2 GU
10 to 100 GU: ±0.5 GU (MAV. Compared to values measured with master body under Konica Minolta standard conditions) |
|
Geometry | JIS Z 8741 (MAV), JIS K 5600, ISO 2813, ISO 7668 (MAV), ASTM D523-08, ASTM D2457-13, and DIN 67530 | |
Measurement Time | Approx. 3.5 second (SCI+SCE measurement)
Approx. 4 second (SCI+SCE+Gloss measurement) Approx. 2.5 second (Transmittance) Approx. 3 second (UV-cut/UV-adjusted; SCI or SCE) |
|
Minimum Interval Between Measurements | Approx. 4 second (SCI+SCE measurement)
Approx. 4.5 second (SCI+SCE+Gloss measurement) Approx. 3 second (Transmittance) Approx. 4 second (UV-cut/UV-adjusted; SCI or SCE) |
|
Sample Viewer Function | Using internal camera
(Image viewable/copiable using optional software such as SpectraMagic NX software Ver. 3.2 or later) |
|
Internal Performance Check*2 | WAA (Wavelength Analysis & Adjustment) Technology | |
Interface | USB 2.0 | |
Target Mask Auto Detection | Yes | |
Power | Dedicated AC adapter | |
Operating temperature / humidity range | 13 to 33°C, Relative humidity: 80% or less (at 35°C) with no condensation | |
Storage temperature / humidity range | 0 to 40°C, Relative humidity: 80% or less (at 35°C) with no condensation | |
Size (W x H x D) | Approx. 300 x 677 x 315 mm | |
Weight | Approx. 14.0 kg |